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A3517 and A3518
Ratiometric Linear Hall-Effect Sensors for High-Temperature Operation
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These parts have been phased out of production as of October 31, 2005.

For new customers or new applications:

• for the A3517, please refer to Allegro A1321, and
• for the A3518, please refer to Allegro A1323.

For existing programs only:

• for the A3517, please refer to the Allegro A3515
  • A3517LUA is replaced by the A3515LUA
  • A3517SUA is replaced by the A3515EUA
• for the A3518, please refer to the Allegro A3516
  • A3518LUA is replaced by the A3516LUA
  • A3518SUA is replaced by the A3516EUA

Features

• Temperature-Stable Quiescent Output Voltage
• Precise Recoverability After Temperature Cycling
• Output Voltage Proportional to Applied Magnetic Field
• Ratiometric Rail-to-Rail Output
• Improved Sensitivity
• 4.5 V to 5.5 V Operation
• Immune to Mechanical Stress
• Small Package Size
• Solid-State Reliability

Description

The A3517xUA and A3518xUA are sensitive, temperature-stable linear Hall-effect sensors with greatly improved offset characteristics. Ratiometric, linear Hall-effect sensors provide a voltage output that is proportional to the applied magnetic field and have a quiescent output voltage that is approximately 50% of the supply voltage. These magnetic sensors are ideal for use in linear and rotary position sensing systems in the harsh environments of automotive and industrial applications over extended temperatures to -40¡ãC and +150¡ãC. The A3517xUA features an output sensitivity of 5 mV/G while the A3518xUA has an output sensitivity of 2.5 mV/G. See the Magnetic Characteristics table for complete, individual device parametrics.

Each BiCMOS monolithic circuit integrates a Hall element, improved temperature-compensating circuitry to reduce the intrinsic sensitivity drift of the Hall element, a small-signal high-gain amplifier, and a rail-to-rail low-impedance output stage.

A proprietary dynamic offset cancelation technique, with an internal high-frequency clock, reduces the residual offset voltage, which is normally caused by device overmolding, temperature dependancies, and thermal stress. This technique produces devices that have an extremely stable quiescent output voltage, are immune to mechanical stress, and have precise recoverability after temperature cycling. Many problems normally associated with low-level analog signals are minimized by having the Hall element and amplifier in a single chip. Output precision is obtained by internal gain and offset trim adjustments during the manufacturing process.

Functional Block Diagram